Mick
J. Maytum
An
improved test standard reflects the needs of today and provides
a useful move toward harmonization with other U.S. and international
standards.
GR-1089-CORE,
Issue 3, came into force in November 2002. It applies to service
provider network equipment and covers electromagnetic compatibility
(EMC) and electrical safety. Three years after the previous issue,
this revision has greater harmonization with other U.S. and international
standards. It includes electrical fast transient (EFT) criteria
and more-rigorous testing. This article is written for those familiar
with the previous version of GR-1089-CORE. It gives an overview
of the section changes and looks at lightning testing in detail.
A second article on page 109 covers ac power fault.
Structure
The new requirement is divided into the same nine sections as
the previous issue: Introduction, System-Level ESD and EFT, Electromagnetic
Interference, Lightning and AC Power Fault, Steady-State Power
Induction, DC Potential Difference, Electrical Safety Criteria,
Corrosion, and Bonding and Grounding. Aside from Section 2, which
now includes EFT in the title, the section titles are unchanged.
Even with the added content, at 236 pages the 2002 edition is
only four pages longer than the 1999 edition.
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|
Figure
1. A 8-kV ESD pulse short-circuit current.
|
System-Level
ESD and EFT. This section is now harmonized with IEC Standard
61000-4-2, "Testing and Measurement TechniquesElectrostatic
Discharge Immunity Test," Edition 1.2, 2001-04. The IEC standard
is a normative reference, and specific clauses within it are called
up in 1089. The IEC reference is a dated one (2001-04), and compatibility
with any future revisions issued by IEC should be checked to see
whether there is a variance from Edition 1.2.
New
for this revision is EFT. EFT testing is meant to correlate with
the real-world equipment effects of ac system switching transients,
such as contact arcing. Testing of telecommunications and power
ports is done by capacitively coupling the EFT signal either by
individual capacitors or by a 1-m capacitive coupling clamp around
the equipment cables. The normative reference for EFT testing
is the IEC standard 61000-4-4, "Testing and Measurement TechniquesElectrical
Fast Transient/Burst Immunity Test," 1995-01. Again, as this reference
is dated, compatibility with any future revisions issued by IEC
should be checked.
 |
|
Figure
2. A 2-kV EFT pulse current in 50 W.
|
In
crude terms, EFT pulses are like an ESD pulse on steroids; more
energy and a higher repetition rate. Figure 1 shows a typical
ESD current waveform at the 8-kV contact level. Figure 2 shows
a typical EFT current waveform at the 2-kV test level. Into a
50-W load, an individual EFT pulse
has a rise time of 5 nanoseconds with a duration of 50 nanoseconds.
These pulses are applied in bursts at 5 kHz (every 200 microseconds)
for test levels up to 1 kV, and 2.5 kHz (every 400 microseconds)
for 2 kV. The burst duration is 15 milliseconds (75 or 37 pulses)
and is repeated every 300 milliseconds (see Figure 3).
Electromagnetic
Interference. Several new technical requirement and measurement
reference documents are now included: CISPR 22, IEC 61000-4-6,
MIL-STD-461E, and TIA/EIA/IS-968. Standards are continually being
updated, and the referenced TIA/EIA/IS-968 (July 2001) has now
been upgraded and revised as TIA-968-A (October 2002). Objectives
have been added for emissions limits for broadband leads and power
ports (ac and dc) along with conducted immunity for broadband
and voiceband leads. A conditional objective for conducted immunity
of power ports is now included.
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|
Figure
3. EFT burst details.
|
Lightning
and AC Power Fault. This section is reviewed in detail in
this article and in the article on page 109. Only a quick summary
of the changes is given here. Harmonization moves have occurred
in two areas. The ITU-T recommendation K.20, power induction i2t
values and primary-equipment protection coordination, has been
integrated into this section. In addition, the use of the UL 60950
Type MDL-2 A fuse has resulted in a new wiring simulator characteristic.
The generator for the current-limiter testing has been modified
to remove a test blind spot. Criteria for current limiters in
digital subscriber line (DSL) applications are given through new
conditional objectives and conditional requirements. Objective
first-level power fault tests (6 through 9) have become requirements,
which is a potential problem area for line feed resistors (LFRs).
Clarifications have been made to the sample plan and first-level
tests. First-level threshold testing of equipment current and
voltage limiters is now done with the current limiter bypassed
and the overvoltage limiter removed. Listing requirements, previously
in this section, have been moved to Electrical Safety Criteria.
Steady-State
Power Induction. A requirement and an objective have been
added for coaxial port immunity to longitudinal steady-state power
induction.
Corrosion and DC Potential Difference. These two sections
are unchanged.
Electrical
Safety Criteria. This section has increased harmonization
with international and U.S. safety standards. Clarification and
guidance have been given in the criteria applied to network equipment,
parts, and circuit packs. The short-circuit testing approach of
ac and dc sources has been reviewed and improved.
|
Designator
|
Condition
|
Edge
|
Time
|
Amplitude
|
|
2/10
|
Open-circuit
voltage
|
Rise
|
2
µs +0/1.0 µs
|
0%/+20%
|
|
Duration
|
10
µs +7/0 µs
|
|
Short-circuit
current
|
Rise
|
2
µs +0/1.0 µs
|
0%/+20%
|
|
Duration
|
10
µs +7/0 µs
|
|
1.2/508/20
(See Note 1)
|
Open-circuit
voltage
|
Rise
|
1.2
µs ± 0.36 µs
|
±10%
|
|
Duration
|
50
µs ± 10 µs
|
|
Short-circuit
current
|
Rise
|
8
µs +1/2.5 µs
|
±10%
|
|
Duration
|
20
µs +8/4 µs
|
|
10/250
|
Open-circuit
voltage
|
Rise
|
10
µs +0/6 µs
|
0%/+16%
|
|
Duration
|
250
µs +150/0 µs
|
|
Short-circuit
current
|
Rise
|
10
µs +0/3 µs
|
0%/+16%
|
|
Duration
|
250
µs +50/0 µs
|
|
10/360
|
Open-circuit
voltage
|
Rise
|
10
µs +0/2.5 µs
|
0%/+15%
|
|
Duration
|
360
µs +108/0 µs
|
|
Short-circuit
current
|
Rise
|
10
µs +0/2.5 µs
|
0%/+15%
|
|
Duration
|
360
µs +108/0 µs
|
|
10/1000
|
Open-circuit
voltage
|
Rise
|
10
µs +0/4 µs
|
0%/+15%
|
|
Duration
|
1000
µs +500/0 µs
|
|
Short-circuit
current
|
Rise
|
10
µs +0/4 µs
|
0%/+15%
|
|
Duration
|
1000
µs +500/0 µs
|
| Note
1: IEEE C.62.41 (1991), 1.2/508/20 combination
wave generator, voltage rise time is measured between
the 30% and 90% points and extrapolated for 0100%. |
|
| Table
I. Waveform tolerance. |
Bonding
and Grounding. Similar to the electrical safety section, clarification
and guidance have been provided in the criteria applied to network
equipment, parts, and circuit packs. The short-circuit testing
approach of ac and dc sources has been reviewed and improved.
General. This new issue of GR-1089-CORE tries to resolve
industry comments on the previous version. The subsection structure
has been changed to avoid repetition, separate out the different
port types, and provide a logical flow. Harmonization with other
standards, where possible, has been carried out. Overall, it is
a worthy successor to the second issue.
Lightning
Generators
With
the exception of the IEEE C62.41 combination waveshape 1.2/508/20,
all of the lightning waveforms were specified as maximum rise
time, minimum duration time, and minimum amplitude. In this issue,
Annex A contains waveform tolerance. For the first time, the minimum
rise time, maximum duration time, and maximum amplitude are specified.
However, this does not mean new impulse generators are required.
The tolerance represents commercial generator values. Table I
shows the waveform values.
One
change has been to modify the four-wire test condition A. A test
has been added with all wires connected to the generator (see
Table II). To allow test facilities to be in place, an Issues
of List Report (ILR) is expected, which delays the introduction
of this four-wire test.
Ports
and Number of Test Samples
Generally,
three samples of the equipment are to be tested. Equipment ports
are either telecommunications, power, or coaxial. In the case
of telecommunications ports, the requirement of three samples
has been changed to three port samples. For single-port equipment,
three pieces of equipment must be tested. For equipment of three
or more ports, three ports of a single piece of equipment are
required to be tested. Testing two-port equipment is awkward.
The test requires two pieces of equipment with testing of two
ports on one piece and testing of one port on the other. For first-level
testing, there shall be no damage not only to the equipment tested,
but also to any host system.
|
Test
Conditions
|
Test
Circuit Connections
|
|
Two-Wire
Interface
|
Four-Wire
Interface
|
|
A
|
Tip
to generator, Ring grounded
|
Each
lead Tip, Ring, Tip1 and Ring1 to the generator in
turn with the other three leads grounded
|
|
Ring
to generator, Tip grounded
|
|
Tip
to generator, Ring to generator
|
Tip
to generator, Ring to generator with Tip1 and Ring1
grounded
|
|
Tip
to generator, Ring1 to generator with Tip and Ring
grounded
|
|
(New)
Tip to generator, Ring to generator, Tip1 to generator,
Ring1 to generator
|
|
B
|
Tip
to generator, Ring to generator
|
Tip
to generator, Ring to generator Tip1 to generator,
Ring1 to generator
|
|
| Table
II. Test configurations. |
Telecommunications
Ports
First-Level
Lightning Tests. The basic tests in this section are unchanged,
but there are changes to the test notes and the voltage-limiter
procedure. Test note 10 now contains a warning about the extra
stress caused by the IEEE C62.41 combination generator (1.2/508/20)
when it is used as an alternative to the 2/10 generator. Although
the combination generator test current and voltage amplitude are
adjusted to that of the 2/10 waveform, the current waveshape is
no longer 8/20. Figure 4 is a plot of the current rise and duration
variation with load resistance. Typically the combination generator
would be testing the equipment with duration two to three times
that of the 2/10 generator.
Test
note 5 now gives guidance on testing at the equipment voltage-limiter
maximum operating threshold. The use of the word threshold
is confusing. Normally it would be considered a voltage level
beyond which the signal starts to be clipped. However, in this
test note, the voltage-limiter maximum operating threshold means
the maximum voltage limiting under surge conditions. The maximum
limited value must be identified. The generator open-circuit voltage
is then set to this level and applied to the port with the limiter
removed. The advantage to this approach is that the equipment
is stressed to the worst-case-condition voltage rather than the
voltage of the fitted protector.
 |
| Figure
4. Combination generator, front and duration variation.
|
For
example, a TISP4350H3BJ thyristor voltage limiter has a typical
10/1000 protection voltage of ±310 V and a maximum guaranteed
value of ±350 V. Under test, this protector would be removed,
and a 350-V generator impulse would be applied to the port. This
test may apply up to 40 V more than the typical protector would
allow. This additional voltage increases the confidence in the
equipment withstand, in spite of the small number of samples used.
Certain
applications have asymmetrical limiting voltages, and the positive
and negative test impulses will be different. For example, a plain
old telephone service (POTS) subscriber line interface circuit
(SLIC) might be tested with 5- and 70-V impulses. Gated thyristor
voltage limiters are often used in a voltage-tracking mode, where
the gate is connected to the protected electronics voltage supply.
The limiting voltage of this arrangement will be the supply voltage
plus the gate-trigger voltage of the thyristor. For example, a
circuit consisting of an integrated circuit (IC) run from a 52
± 2-V supply combined with a TISP61089B gated limiter having
a maximum trigger voltage of 2.5 V would be tested with a 56.5-V
impulse.
Compared
with 10/360 or 10/1000 testing, 2/10 testing has two problems:
identifying the maximum limiting level and the possible circuit
overstress. Voltage limiter manufacturers do not often quote the
2/10 voltage-limiting performance. Rather, they merely state that
the limiter survives a certain 2/10 test condition. The faster-rising
and higher-current 2/10 impulse causes the maximum limiting voltage
to increase, often by 15% or more. The previously mentioned TISP61089B
gate-trigger voltage rises from 2.5 V on 10/1000 to 12 V on 2/10,
making the 2/10 test voltage 66 V.
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|
Figure
5. Longitudinal coordination testing.
|
For
voltage-clamping devices (e.g., an MOV), applying a 2/10 impulse
of the appropriate amplitude is acceptable because the 2/10 impulse
has a smaller volt-second integral than the limiter voltage. For
switching devices such as a thyristor, applying a 2/10 impulse
equal to the maximum voltage limiting could cause IC failure because
the 2/10 volt-second integral is larger than the worst-case-condition
limiter voltage. The switching devices have a dynamic voltage
overshoot condition that truncates the impulse voltage. The IC,
therefore, is exposed to a much shorter voltage overstress than
the overstress that occurs with a 2/10 voltage impulse of the
same amplitude.
Because
the IC voltage withstand is time dependent, the abnormally long
overstress from a full 2/10 impulse could cause failure.1
To follow the intent of note 5, the test impulse wave shape should
be the similar to the limiter wave shape. Using a 1/2 wave shape
for switching limiters (corresponding to asynchronous primary
GDT sparkovers) would probably be more appropriate. However, a
1/2 generator is not standard. If the equipment does not survive
testing with a 2/10 impulse, then further investigation is required,
which could lead to an exemption request or alternative verification
based on the above criteria.
Second-Level
Lightning Tests. The basic 2/10 test is unchanged. The warning
on the use of the combination generator is repeated, and testing
at the equipment voltage-limiter threshold can be skipped if this
test was passed in the first level.
Coordination.
The 10/1000 primary-equipment coordination objective (desirable
performance) is optional beginning January 1, 2005. It is required
(must comply) beginning January 1, 2006. The 10/1000 generator
open-circuit voltage is fixed at 1 kV for normal first-level equipment
testing, but can be between 400 V and 2 kV for coordination testing.
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|
Figure
6. Transverse (metallic) coordination testing.
|
Figures
5 and 6 show the coordination test configurations. If the primary
protector has a series current-limiting element (e.g., a heat
coil) the element impedance aids coordination. To comprehend this,
an equivalent impedance is connected to the equipment terminals
so that the measured system-voltage values incorporate the series
impedance voltage. The actual primary-protector series element
is not used for this test because it may fail. Bizarrely, the
GR-974-CORE primary requirement only tests nonresetting and self-resetting
current limiters to 25 A, 10/1000 and not 100 A, 10/1000 or a
10/1000 voltage wave shape with an amplitude equal to the primary
limiting voltage. Besides the generator open-circuit voltage,
the GR-1089-CORE coordination test circuits are the same as the
equipment test circuits.
To
determine the coordination test level, the generator open-circuit
voltage is set to the maximum voltage of the specified primary
protector. GR-974-CORE, Issue 3 (June 2002), protectors have voltage
levels of 400, 600, and 1000 V. The 1000-V level matches the GR-1089-CORE
default carbon-block primary protector. The voltage and current
levels at the system terminals are monitored when an impulse is
applied. If the measurement at the initial generator voltage setting
does not result in either the primary-protector voltage or a current
flow of 100 A, the generator voltage is increased by 200 V, and
the impulse applied again. This process is repeated until the
system develops the required voltage, or conducts 100 A, or equipment
failure occurs.
Voltage
interpolation is allowed in order to avoid overstressing the equipment.
For example, if a generator voltage of 1000 V produced a current
of 95 A peak, increasing the generator voltage by 200 V to 1200
V would result in a 114-A current, possibly causing equipment
damage. This is not the intent of the test, and the generator
should be set to an interpolated value of 1000 ´ 100/95 = 1050
V to produce 100 A.
 |
|
Figure
7. Coordination testing peak power increase.
|
When
the coordination level has been determined, the equipment is further
tested with impulses in each polarity in the longitudinal and
transverse test configurations. To pass, the equipment must not
fail during testing.
The
Telcordia coordination condition requires that the system is not
damaged. It also requires that the system terminals develop specified
GR-974 primary-protector voltage or conduct 100 A or both. This
is different from the ITU-T coordination testing that requires
the primary protector to operate.2
The
Telcordia coordination rationale is that the normal GR-974-CORE
primary protector can conduct a maximum of 100 A, 10/1000. GR-1089-CORE
equipment can conduct a maximum of 100 A, 10/1000. Low-impedance
equipment has the same current capability as the primary protector,
and, hence, the coordination requirement is to withstand 100 A,
10/1000. Although the primary protector is prevented from operating,
the equipment can withstand the expected current. High-impedance
equipment develops more voltage and less current; therefore, the
coordination requirement is to withstand the maximum primary-protector
voltage. The GR-1089-CORE coordination criteria account for legacy
equipment using fused current limiters. However, equipment using
resistive current limiters may have problems.
Assuming
that the current-limiter resistance is the largest component of
equipment input resistance under impulse conditions, the voltage
across the limiter and the current through it will be the result
of a resistive divider action with the 10/1000 generator 10-W
source impedance. During 1000-V 10/1000 equipment testing, a 10-W
current limiter will develop 500 V and conduct 50 A. During coordination
testing for a 1000-V primary protector, the same limiter will
develop 1000 V and 100 A, a normalized power increase of four
times. For resistance values higher or lower than 10 W,
the coordination test peak-power-increase factor will be less
than 4. Figure 7 shows how the normalized peak power varies with
resistance.
Normal
SLIC LFRs would need peak power capabilities about 50% higher
than present. Low-resistance positive-temperature-coefficient
(PTC) thermistors could require peak power capabilities from 1.5
to 4 times higher than present. The energy levels involved may
even cause the PTC thermistor to trip into a high-impedance state.
Tripping could cause the PTC thermistor to fail as a result of
being exposed to the generator's nearly full open-circuit voltage.
 |
|
Figure
8. Nonlinear current-limiter test connection.
|
One
equipment builder achieved more than a 50:1 reduction in field
failure rate when he changed from using low-resistance LFRs to
fuses. Both equipment variants were 1089-compliant at that time.
It has been shown that coordination requires a higher-capability
LFR, and lack of coordination may have been part of the failure
problem.
Nonlinear
current limiters, such as the GR-974-CORE fast current limiter
(circuit voltage or current activated), cannot be emulated by
a fixed value of series impedance. Therefore, the actual current
limiter must be connected to the equipment terminals (see Figure
8). The failure criteria should then include the fast current
limiter as well. Limiter failure can occur if the equipment terminals
don't develop enough voltage for the limiter to operate correctly.
GR-974-CORE uses a fast current-limiter test circuit (Figure 6-4
in the standard) with a specified equipment load resistance of
1 W.
Intrabuilding
Lightning Surge Tests. The basic 2/10 tests are unchanged.
It also includes the familiar note changes concerning the combination
generator warning and equipment voltage-limiter threshold test
method.
Lightning
Surge
There
are no test changes in the subsection AC Power PortFirst and
Second Level Lightning Surge Tests. There are also no test changes
in the subsection Coaxial Cable Ports and Broadband Communications
EquipmentFirst and Second Level Lightning Surge Tests.
Conclusion
The changes to the previous lightning tests are incremental and
reasonable. When the coordination test comes into force it could
have a major influence on resistive current limiters.
References
1. MJ Maytum et al., "Coordination of Overvoltage Protection and
SLIC Capability," in The 2000 International IC China Conference
Proceedings (Beijing: Global Sources Ltd., March 2000), 8792.
2.
MJ Maytum, "The New ITU-T Telecommunication Equipment Resistibility
Recommendations," Compliance Engineering 19, no. 1 (2002):
3037.
Mick
J. Maytum is applications director for Bourns Ltd. (Bedford, UK).
He can be contacted at mick.maytum@bourns.com.