|
Parameter |
ESDA
Standard |
MIL
Standard |
Comments |
| 1.
Oscilloscope BW single shot |
350
MHz |
350
MHz |
BW
= Bandwidth |
| 2.
Waveform specified for: |
Six
levels (0.25–8 kV) |
Four
levels (0.5–4 kV) |
|
| 3.
Current probe (CP) |
350
MHz mininium |
350
MHz |
|
| 4.
CP-I capability |
12
A mininium |
None
mentioned |
|
| 5.
CP-Tr
capability |
<
1 nanosecond |
None
mentioned |
Tr
= rise time |
| 6.
Current probe example |
CT-1
|
CT-1 |
|
| 7.
CP cable length |
1
m maximum |
0.91
m maximum |
|
| 8.
Short wire (copper) |
18–24
AWG |
No
mention |
|
| 9.
Short-wire length |
Two
farthest pins in socket |
Worst-case
pin pair |
Not
the same |
| 10.
Ir
(ringing) |
<15%
Ips
|
Same
|
Using
the short wire |
| 11.
Ips
(short) |
Extrapolated
|
Peak
position |
Using
the short wire |
| 12.
Ips
(measured) |
No
written instructions |
Peak
position |
|
| 13.
Tr
(short, all voltage levels) |
2–10
nanoseconds |
<10
nanoseconds |
Quite
different |
| 14.
Td
(short measured) |
Ips
position (nonzero time) |
Ip
(100%, nonzero time) |
Td
= decay time |
| 15.
Td
(short, all levels) |
150
± 20 nanoseconds |
150
± 20 nanoseconds |
|
| 16.
Td
(500 W) |
Not
used |
Not
mentioned |
|
| 17.
500-W load |
±1%
at 1000 V |
Not
mentioned |
|
| 18.
Ipr
(500 W) |
1000
V |
Not
mentioned |
|
| 19.
Ipr
(500 W, measured) |
Maximum
peak position |
Not
mentioned |
|
| 20.
Ipr (
(500 W) |
375–550
mA |
Not
mentioned |
|
| 21.
Ipr
/Ips
ratio |
>=
63% |
Not
mentioned |
|
| 22.
Tr
(500 W, measured) |
1000-V
level |
Not
mentioned |
|
| 23.
Tr
(500 W) |
5–25
nanoseconds |
Not
mentioned |
|
| 24.
Irr
(ringing short) |
15%
o Ipr |
Same
|
Ringing
using 500 W |
| 25.
Ringing short |
None
beyond 100 nanoseconds |
Same |
|
| 26.
Equipment calibration |
Includes
additional equipment |
Same |
|
| 27.
Tester qualification |
1,
2, and 4 kV |
4
kV only |
|
| 28.
Waveform verification |
Once/shift
(at beginning) |
Same
|
When
to measure |
| 29.
Waveform verification |
Pulse
1+ and 1 |
Same
|
Number
of pulses |
| 30.
"No Connects" |
Tested
|
Not
tested |
|
| 31.
Classification |
Six
levels |
Four
levels |
|
| 32.
Timing interval |
300
millisecoonds |
1000
milliseconds (1 second) |
|
| 33.
Device testing |
Can
start at any level |
Can
start at any level |
|
| 34.
Device classification |
Seven
classes 250 >= 8 kV |
Three
classes 0 ® 4000 |
|
| 35.
Device testing |
Room
temperature |
Room
temperature |
|
| 36.
500-W resistor |
Low
inductance |
Not
mentioned |
|
| 37.
Terminal reversal |
Not
allowed |
Not
recommended |
|
| 38.
Socket grounded between pulses |
Yes
|
Yes |
|