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PCB
Layout: The Impact of Lightning and Power-Cross Transients
Helpful
data can ease the process of designing for immunity to lightning
and power-cross events to meet the requirements of GR-1089-CORE.
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| Layout
without solder mask (above) and with solder mask (below).
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With
the continuing efforts to increase product functionality while
decreasing product size, designers are being asked to place
more and more functionality on individual printed circuit boards
(PCBs). As PCBs become more densely populated, many new challenges
arise.
For boards containing circuits that interface with outside-plant
tip/ring pairs, one such challenge is maintaining immunity to
lightning strikes and unintentional power-line contact (power
cross). This article explores this challenge as it relates to
PCB layout. Through experimentation and analysis, this article
provides designers with data to use as a tool when laying out
circuits that will interface with outside plant wiring.
With product size decreased and component density increased,
PCB real estate quickly becomes limited. Designers must decide
on board dimensions, component placement, and layer count: factors
that can affect both product performance and cost. This task
is further complicated when the product in question contains
circuits that could be exposed to external lightning and power-cross
events.
Component and trace spacings are critical to avoid arcing during
high-voltage transients. Trace width is critical to avoid blown
traces during high-current transients. Although designers want
to design products that are immune to such events, they do not
want to overburden a design with placement and routing constraints
that are excessive. To ensure optimum efficiency during board
layout, designers must have a thorough understanding of the
properties PCB traces exhibit during transient events. This
article discusses the results of an experiment intended to quantify
the physical characteristics of a multilayer PCB during high
voltage and high current transients.
The findings were obtained by performing the following tests
on multiple PCB test samples: 10 x
1000-microsecond, 1000-V, 100-A surge; 2 x
10-microsecond, 2500-V, 500-A surge, and one 600-V, 60-A power-cross
transient. These events were taken from Telcordia's GR-1089-CORE.1
They represent the worst-case energy dissipation that a PCB
can experience during formal testing and be expected to survive.
Although not required by GR-1089-CORE, it is advantageous for
an overcurrent protection device to interrupt the 600-V, 60-A
power-cross transient rather than the PCB traces. Interrupting
the transient allows for repair of the product not only in the
lab but also once installed in the field, which eliminates the
cost of a new circuit pack.
The requirements detailed in GR-1089-CORE were developed around
the performance characteristics of a standard 3-mil carbon block.
The carbon block is considered to have the greatest let-through
energy of all of the commonly used primary protectors in the
telecommunications industry. Test samples were evaluated under
various conditions to simulate not only ideal-case scenarios,
but also real-world conditions a board might experience due
to manufacturing issues and years of service in the field.
The experiment had five objectives, which are discussed below:
-
To determine the minimum trace-to-trace spacing required on
external and internal layers of a PCB to ensure no dielectric
breakdown during the application of the 2500-V, 500-A, 2 x
10-microsecond first-level surge defined in GR-1089-CORE.
To obtain values for a clean board, a board containing solder
flux, and a board coated with the hygroscopic spray solution
detailed in GR-63-CORE.2
- To
determine the minimum trace-to-trace spacing required on external
and internal layers of a PCB to ensure no dielectric breakdown
during the application of the 1000-V, 100-A, 10 x
1000-microsecond first-level surge defined in GR-1089-CORE. To
obtain values for a clean board, a board containing solder flux,
and a board coated with the hygroscopic spray solution detailed
in GR-63-CORE.
- To
determine the minimum trace width required on external and internal
layers of a PCB to ensure that a trace does not become an open
circuit during the application of the 2500-V, 500-A, 2 x
10-microsecond first-level surge defined in GR-1089-CORE.
- To
determine the minimum trace width required on external and internal
layers of a PCB to ensure a trace does not become an open circuit
during the application of the 1000-V, 100-A, 10 x
1000-microsecond first-level surge defined in GR-1089-CORE.
- To
determine the minimum trace width required on external and internal
layers of a PCB to ensure the trace's fuse characteristics are
greater than that of a Bussman Type MDQ 1-6/10-A fuse when subjected
to the 600-V, 60-A second-level power-cross transient detailed
in GR-1089-CORE.
For this experiment, a four-layer PCB was designed by Underwriters
Laboratories (UL) and fabricated by an outside board vendor.
A four-layer board was chosen because it allowed for data collection
on the surface as well as on the internal layers. Two batches
of boards were fabricated, one with solder mask and one without.
Each batch used the same trace layout. Figures
14 show a view of the trace layout for each layer.
The photos show each type of board used. The physical specifications
for the boards were as follows:
-
Four-layer PCB measuring 4.00 x
4.75 in.
-
Industry standard 0.062-in. FR-4 laminate.
-
Standard 1-oz. finish copper weight.
-
Dielectric constant of 4.6 (±0.2) for each layer.
To quantify the dielectric properties of the spaced traces on
the PCBs, a calibrated dielectric withstand tester was used
to apply a dc potential (maximum 5000 V) between the traces
(see Figure 5). The following layers were evaluated:
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| Figure
5. A calibrated withstand tester was used to apply a dc
potential between the traces. |
-
Surface
layer with solder mask. The board was cleaned with flux cleaner
to remove impurities.
-
Surface layer with no solder mask. The board was cleaned with
flux cleaner to remove impurities.
- Surface
layer with no solder mask. The board was cleaned with flux cleaner
to remove impurities and then coated with the hygroscopic dust
solution described in GR-63-CORE. After drying for 24 hours, the
board was then placed in a humidity chamber. The humidity was
set at the value required to produce 1 MΩ on the IPC
coupon detailed in GR-63-CORE. (IPC refers to Institute for Interconnecting
and Packaging Electronic Circuits.)
- Surface
layer with no solder mask. The board was cleaned with flux cleaner
to remove impurities and then lightly coated with solder flux.
- Internal
layer.
To quantify the current-carrying properties of the various traces,
the boards were subjected to the 2500-V, 500-A, 2 c
10-microsecond lightning surge, the 1000-V, 100-A, 10 x
1000-microsecond lightning surge, and the 600-V, 60-A power-cross
transient detailed in GR-1089-CORE. Tables
IIV and Figures
68 present the data gathered from the experiment.
A KeyTek (Lowell, MA) ECAT surge generator was used to produce
the lightning waveforms, and a UL-built power-cross generator
was used to produce the power-cross transient. Lightning waveforms
were monitored using a calibrated digital oscilloscope (see
Figure 9).
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| Figure
9. Lightning waveforms are monitored using a calibrated
digital oscilloscope. |
Power-cross
values were monitored using calibrated digital meters (see Figure
10). The following layers were evaluated: surface layer with
no solder mask, surface layer with solder mask, and internal
layer.
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| Figure
10. Power-cross values are monitored using calibrated digital
meters. |
Analysis
The experiment revealed minimum trace-to-trace spacing required
on external and internal layers of a PCB. The minimum spacings
to ensure no dielectric breakdown during the application of
the 2500-V, 500-A, 2 x
10-microsecond first-level surge defined in GR-1089-CORE are
as follows:
-
<
7 mil for a surface-layer trace with solder mask.
- >
40 mil for a surface-layer trace with no solder mask and which
is clean (free of dust and solder flux).
- >
40 mil for a surface-layer trace with no solder mask and that
has been exposed to the hygroscopic dust spray detailed in GR-63-CORE.
- >
60 mil for a surface-layer trace with no solder mask and that
has been exposed to solder flux.
- <
7 mil for an internal-layer trace.
To
ensure no dielectric breakdown during the application of the
1000-V, 100-A, 10 x
1000-microsecond first-level surge, the minimum trace-to-trace
spacings are as follows:
-
< 7 mil for a surface-layer trace with solder mask.
- Minimum
7 mil for a surface-layer trace with no solder mask and that is
clean (free of dust and solder flux).
- >
10 mil for a surface-layer trace with no solder mask and that
has been exposed to the hygroscopic dust spray detailed in GR-63-CORE.
- >
20 mil for a surface-layer trace with no solder mask and that
has been exposed to solder flux.
- <
7 mil for an internal-layer trace.
The
experiment also revealed the minimum trace width required on
external and internal layers of a PCB. To ensure a trace does
not become an open circuit during the application of the 2500-V,
500-A, 2 x
10-microsecond first-level surge defined in GR-1089-CORE, the
following trace widths are required, depending on the layer:
-
Minimum 7 mil for a surface-layer trace with no solder mask.
- <
7 mil for a surface-layer trace with solder mask.
- Minimum
10 mil for an internal-layer trace.
To
ensure a trace does not become an open circuit during the application
of the 1000-V, 100-A, 10 x
1000-microsecond first-level surge, the following minimum trace
widths are required on external and internal layers of a PCB:
-
> 10 mil for a surface-layer trace with no solder mask.
- >
7 mil for a surface-layer trace with solder mask.
- Minimum
15 mil for an internal-layer trace.
A
minimum trace width is required on external and internal layers
of a PCB. This minimum trace width ensures the trace's fuse
characteristics are greater than that of a Bussman Type MDQ
1-6/10A fuse when subjected to the 600-V, 60-A second-level
power-cross transient detailed in GR-1089-CORE. The following
minimum widths are required:
- Minimum
20 mil for a surface-layer trace with no solder mask.
- Minimum
15 mil for a surface-layer trace with solder mask.
- Minimum
22 mil for an internal-layer trace.
Several observations were made from the data. Surface-layer
traces with no solder mask have a lower dielectric breakdown
voltage than surface-layer traces with solder mask. Internal-layer
traces have a higher dielectric breakdown voltage than surface-layer
traces. Surface-layer impurities lower the dielectric breakdown
voltage, and surface-layer traces with no solder mask have a
lower current-carrying capacity than surface-layer traces with
solder mask. Finally, internal-layer traces have a lower current-carrying
capacity than surface layers.
The information presented in this article is not meant to be
a rule book for designers to use when laying out circuits exposed
to external transients. Rather, it should be used as one of
many tools to successfully design a circuit that is immune to
surge and power-cross transients.
Although this experiment concentrated on the impact that both
high voltage and high current transients have on PCB traces,
these data can be used to aid in component selection, component
placement, and connector pin assignments. Surge suppression
devices and overcurrent protection may help reduce the trace
spacing and width constraints presented in this article. By
coordinating these devices with the data provided in this article,
arcing and blown traces should be avoided during formal testing
and, hopefully, during field service as well.
1. Bellcore GR-1089-CORE, Issue 2, Rev. 1, "Electromagnetic
Compatibility and Electrical SafetyGeneric Criteria for
Network Telecommunications Equipment," Telcordia Technologies,
Morristown, NJ, February 1999.
2. Bellcore GR-63-CORE, Issue 1, "NEBS Requirements: Physical
Protection," Telcordia Technologies, Morristown, NJ, October
1995.
Milton
Hilliard is senior project engineer for Underwriters Laboratories
RTP (Research Triangle Park, NC). He can be reached at milton.p.hilliard@us.ul.com.
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