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Product Safety: New Developments in Hipot Testing
John
Jansen
Automated
hipot testing makes it possible to produce fully traceable
records of electronic products tests to maximize safety
and minimize liability.
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Illustration
by TAISHA PAYTON
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The
hipot testalso known as flash, high-voltage, or dielectric
strength testis one of the more controversial electrical
safety tests and has provoked much discussion and debate.
In fact, hipot testing is not a measurement, but rather
a procedure that aims to illustrate whether a product
remains safe when subjected to high voltage and whether
the user is protected from danger. The test is designed
to detect insufficient gaps or clearances between conductive
parts and earth. It should also show whether degradation,
such as pinholes or cracks in insulation and other protection
devices, has resulted through production processes or
wear and tear.
The
test applies high voltage to the product to check the
insulation between the live conductors and exposed metal
surfaces. For Class I equipment, the high voltage is applied
between conductors and earth. For Class II equipment,
the high voltage is applied between the conductors and
the outer surface of the product.
Developments
Although
there have been few noticeable alterations in the hipot
testing requirements of most standards in recent years,
many changes have been made to the technical specifications
of electrical and electronic products. Such modifications
have been prompted by technical standards such as the
Electromagnetic Compatibility (EMC) Directive. For example,
EMC considerations have required the introduction of circuit
devices on the supply input to prevent emissions back
into the mains.
These
devices often take the form of resistive and capacitive
circuits. When tested using an ac hipot test, these circuits
often prove problematic because the capacitive part can
induce leakage currents in excess of the capacity of the
test instrument. Situations such as these have led to
a substantial increase in the use of dc hipot testers
that are unaffected by this capacitive effect.
The
test is designed to ensure the safety of the product and
to ensure that manufacturers meet legislative demands
in relation to product liability and due diligence. Hipot
testing, ground-bond testing, and insulation-resistance
measurement are probably the three core tests for electrical
safety testing.
Identification
and Traceability
The
hipot test can be regarded as a negative test on the basis
that a good product most likely does not provide a measurable
flow of leakage. With the development of modern instrumentation
using microprocessor control and data-logging software,
it is now possible to produce fully traceable records
of testing undertaken.
Knowing
why flash testing is necessary is important, but being
able to prove that electrical or electronic products comply
with the various standards is also vitalparticularly
if a subsequent failure or fault is identified.
The
only effective means of demonstrating that a product has
been tested properly is through sufficient documentation.
The latest available testers automate the testing process
on the production line and retain results in an internal
memory for later download or print out. Documentation
through automated hipot testing minimizes liability and
provides effective proof at the end of the manufacturing
process that a product is safe.
Test
Conditions
Two
distinct forms of testing are usually recognized: type
testing and production line testing.
Type-testing
levels vary according to the relevant product-specific
standard. Class I equipment normally requires between
1000 and 1500 V applied for 1 minute with a trip level
of up to 100 mA. Some standards specify that "no flashover
shall occur," suggesting that the trip level should be
0 mA. But, because all devices have a small amount of
leakage, 0 mA is not practical. A low level of between
3 and 5 mA is usually selected. A higher level should
be used if the device under test (DUT) has large capacitive
leakage.
For
Class II equipment, voltages are usually between 2500
and 4200 V, but with timing and trip settings similar
to Class I equipment. The same criteria for the fault-trip
levels are applied to both Class I and Class II products.
Production
line hipot testing requires special considerations in
terms of conditions such as duration and voltage levels.
On the production line, the need to have faster, but equally
rigorous, tests is addressed by applying 10% overvoltage,
but reducing the test duration to a few seconds. Therefore,
a type test with a voltage rating of 1250 V would be carried
out at 1375 V on the production line, with trip levels
of 5 mA. Often, the annex section of a standard advises
routine testing. When a recommendation is not available,
the manufacturer must apply a suitable test-voltage level
to ensure that the device is safe to be offered for sale.
One
note of caution is that it is possible to get an apparently
satisfactory result when the equipment under test is switched
off or not properly connected. It is imperative to ensure
that the equipment is switched on and properly connected.
Even for experienced operators, this can be a challenge.
In a production line situation, such problems are greater
because of the greater throughput of products. Solutions
include:
-
A
simple continuity test, applied on live and neutral,
built in to the test program prior to the flash test.
-
The
detection of capacitive leakage that occurs whenever
an ac hipot is applied. If no leakage is detected, a
warning is initiated.
-
Regular
fault simulation at the test connection point.
Pass-Fail
Criteria. The test itself is not quantitative, and
"fail" is recorded if a breakdown of insulation or a flashover
between components occurs. Most testers indicate pass
or fail via a warning light or sound that activates when
5 mA of leakage occurs.
Hipot
and Insulation Testing. On first examination, these
two tests appear very similar. However, hipot testing
is designed simply to detect gaps or clearances between
conductive parts and earth, pinholes in insulation, and
other degradation. Insulation resistance testing is designed
to provide an actual quantitative measurement of the insulation
quality.
If
a wire were positioned 1/2
mm from exposed metal, an insulation testconducted
in dry airmight easily provide a pass reading. A
hipot test, however, is more likely to detect this situation
as dangerous. Similarly, if insulation were somehow contaminated,
a hipot test would produce a pass, whereas an insulation
test would highlight a deficiency. For example, the normal
minimum insulation resistance value for Class I appliances
is 2 M(omega). With a 1500-V hipot test, the current would
be 0.75 mA and would not be detected by the 5-mA trip
that must accommodate the capacitive losses that occur.
Obviously a dc hipot test with a leakage meter can provide
insulation resistance monitoring because the capacitive
component is overlooked after the initial inrush.
Test
Duration. The best way to maximize productivity is
to minimize the time taken to apply all of the safety
and functionality tests. By using an integrated test station
and enclosure connection to the DUT, only one test sequence
is required. Establishing a connection is often the most
time-consuming part of production line testing, so combining
four or five tests at an integrated test station can significantly
reduce test times.
Production
Line Safety. Type tests often call for high levels
of high voltages to be applied for up to 1 minute. This
is not practical in production facilities. In many facilities,
a 1-minute test would adversely affect productivity. The
call for a 100-mA trip level can be potentially lethal.
In addition, voltage levels and test procedures realistically
demand a skilled operator.
Because
production line hipot testing is conducted with reduced
test times, it reduces the risk to operators. Effectively
designed test instruments mean that the required operator
skill level can be reduced, and the use of high trip levels
can be protected by a key system for which only qualified
operators have access.
Safe
Test Areas. With the integration of electrical safety
testing standards in EN 50191, specific safety conditions
have been specified for all locations where electrical
testing is carried out.1 For example, the use
of test enclosures on the production line is advisable
to maximize the safe working area around the points where
flash tests are to be applied.
The
type test, with its high-level leakage limits at 100 mA,
is potentially lethal to the human body. Hence, type testing
is carried out in a laboratory and not on a production
line. The test is also only to be carried out by a skilled
person who is aware of the potential hazards and who is
following procedures clearly defined before any test is
applied. The ideal situation is for the DUT to be enclosed
in a safety-test enclosure with automatic isolation of
the test points on the enclosure opening. This enclosure
protects the test technician from electrical sources as
well as from airborne particles caused by an unforeseen
failure of the DUT that terminates in an explosion.
Class
II Equipment
In
Class II equipment, the absence of an earth requires protection
via primary and secondary insulation. Hipot testing of
Class II equipment involves much higher voltage levels,
typically between 2500 and 4200 V. A common problem, particularly
on new equipment, is that failure can be detected on the
primary insulation that is undetectable by a hipot test
on the outer surface, which tests the secondary insulation
only. Testing programs must include both tests.
To
test the primary protection, the selected method must
access the primary insulation. This is essentially a contradiction
in terms, because this connection needs to be inaccessible
metal. However, experience shows the following options
are feasible:
-
Test
the primary insulation prior to final assembly. Be sure
to check that on assembly no degrading of this protection
takes place (e.g., screws penetrating the insulation).
-
Design
the product with an access that can be permanently sealed
after testing. This is often an element that product
designers fail to anticipate.
-
Design
test jigs and probes that allow access through the enclosure,
ensuring that the integrity of the product (in terms
of the relevant standard finger tests) is maintained.
Testing
also needs to be carried out on the secondary protection.
Standards generally require that the product be wrapped
in aluminum foil so that high voltages can be applied
to all outer surfaces. This test may be practical for
laboratory situations, but it is impractical for production
testing, because of both the complexity in test setup
and time required and because the outer surfaces of the
product must be easily marked. The use of conductive foam
in a special jig creates a nest or envelope around the
outer surface of the product; test voltages can then be
applied. Although this method is not quoted in standards,
the standards authorities recommend this procedure.
Does
Hipot Testing Degrade Insulation? The view that hipot
testing is essentially a destructive test is often an
area of discussion. This view originates from the use
of flash in type testing where the long time period required
provides potential for the degradation of insulation.
However, in terms of production line testing, the reduced
time period and the 5-mA trip setting significantly reduce
this risk. The fact remains that many manufacturers successfully
conduct the test without witnessing any degradation. Under
certain circumstances, an ac flash test could corrupt
sensitive electronic components.
Sensitive
Equipment
In
situations in which ac hipot testing could corrupt sensitive
electronic components, the following solutions are possible:
-
Use
a dc hipot test. The voltage must match the specified
peak ac voltage, which is achieved by multiplying the
specified ac voltage by 1.414. A discharged facility
following application ensures that no residual voltage
remains.
-
Use
a soft dc hipot test. This test requires ramping up
to the required voltage. In some instances, this test
can benefit from ramping down as well. This process
involves a slow ramp up from zero to the required value,
and then holds for a timed period before ramping back
down to zero and discharging the unit under test.
The
advent of measures to control EMC has increased the use
of suppression devices, but these can cause problems for
hipot testing. It should be noted that most designers
of such components have upgraded their products to meet
the specified tests. However, in some cases the following
solutions may be necessary:
-
Disconnect
such components. Some standards allow disconnection
for safety testing. However, it is important to note
that disconnection is often impractical for production
line testing.
-
Set
higher trip levels (e.g., 10 or 15 mA). The use of this
option should always be accompanied by the use of safety
precautions such as key-locked switches, thereby ensuring
proper authorization to conduct the test. The safest
solution in such circumstances is to conduct the test
with the test item housed in an enclosure and with appropriate
interlocks. Such precautions do not need to be complicated
or expensive to provide maximum operator safety.
-
Apply
the high-voltage test from a dc voltage source. Almost
all standards now provide for this option. The test
voltage is the ac level times 1.414 to provide the suitable
dc test voltage. A dc voltage will ignore the capacitive
leakage levels.
The
hipot test is designed to indicate whether a product remains
safe when subjected to high voltage and whether the user
is protected from danger. Being able to prove that electrical
or electronic products comply with the various standards
is particularly important if a subsequent failure or fault
is identified.
To
demonstrate that a product has been tested properly, manufacturers
must provide sufficient documentation. Many testers now
automate the testing process on the production line and
retain the results. Documentation through automated hipot
testing maximizes protection from liability and provides
effective proof at the end of the manufacturing process
that a product is safe.
Reference
1. EN
50191, "The Erection and Operation of Electrical Test
Installations," European Committee for Electrotechnical
Standardization (CENELEC), Brussels, 2000.
John
Jansen is vice president of Clare Instruments U.S. Inc.
(Tampa, FL). The company manufactures equipment for the
electrical safety testing of tools, electrical appliances,
and equipment. Jansen can be reached at usa@clareinstruments.com
or at 813-886-2775.
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