| Tip Voltage | Target-Chain Dc Attenuation | Time Domain | Random Effects | |||||||
| Measured Parameter | Voltimeter Accuracy | Simulator Setting Resolution | Current Source Accuracy | Oscilloscope Vertical Accuracy | Oscilloscope Time Measurement Accuracy | Measurement System Rise Time (BW). Incl. Target | Tip Voltage Repeatability | Dc Amplitude Repeatability | Rise Time Repeatability (I,E or H) | Peak Time Repeatability (I,E or H) |
| Simulator tip voltage | X | X | X | |||||||
| Targetchain dc accuracy | X | X | X | |||||||
| Rise time | X | X | X | |||||||
| Peak current | X | X | X | X | X | X | X | X | ||
| + Derivative | X | X | X | X | X | X | X | X | X | X |
| – Derivative | X | X | X | X | X | X | X | X | X | X |
| Current at 30 ns | X | X | X | X | X | X | X | |||
| Current at 60 ns | X | X | X | X | X | X | X | |||
| Table VI. Uncertainty contributions. | ||||||||||