Using an ESD-Pulse Validation System for Equipment Evaluation
Designed for daily validation of test equipment, the system
makes possible longer intervals between calibrations.
A low-cost apparatus makes possible rapid, reliable validation
of ESD guns. The system validates the peak current of ESD
pulses, and the secondary current at 30 nanoseconds, as
described in the IEC 61000-4-2 standard, and indicates via
two LEDs whether these currents are within tolerance.
The apparatus is not the calibration equipment required
by IEC 61000-4-2, involving an expensive test setup with
a single-shot fast oscilloscope and a shielded room, or
even an anechoic room. In addition to performing annual
calibration of the ESD gun, EMC test houses need to quickly
check the ESD waveform each test day. This requirement is
imposed by EN 45001 accreditation rules which state that
test equipment should be verifiednot calibratedeach
test day to ensure that it is working properly. The tool
described here can fill that need for daily validation.
A simple but effective system to validate the shape of
the waveform (see Figure 1) before each ESD test can stretch
the interval between costly ESD-gun calibrations. A typical
ESD calibration setup as described in IEC 61000-4-2 costs
about 10 times as much as the validation system proposed
in this article, owing particularly to the cost of the oscilloscope.
The economical ESD validation system described below evaluates
the ESD waveform at two critical points:
Two go/no-go LEDs indicate if the waveform is within a
set tolerance which is slightly larger than the tolerances
given in IEC 61000-4-2.
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Figure 1. An ESD pulse according to
IEC 61000-4-2.
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Functional Description of the Apparatus
The electrostatic-discharge waveform contains high-frequency
components ranging up to several gigahertz. In order to
preserve the steep rising and fall times of the pulse, the
ESD-pulse validation apparatus is built from very fast electronic
components. Figure 2 is a block diagram of the apparatus.
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| Figure 2. Block diagram of the ESD-validation apparatus.
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ESD-Pulse Analysis. Before measurement commences,
the apparatus is reset and armed manually. The ESD gun discharges
through the Pelligrini target (see discussion below). The
signal is divided between two evaluation circuits by a resistive
splitter.
In the first circuit, the first peak current is evaluated.
The ESD pulse spends 28 nanoseconds in a delay line, then
is applied to a peak-hold circuit followed by an analog
comparator and an analog-to-digital (A/D) signal convertor.
As soon as the voltage level over the peak-hold circuit
reaches a preset minimum value, the analog comparator triggers
the A/D converter and measurement starts. The trigger pulse
is delayed by 2 nanoseconds, the time required to set up
a data latch. Data at the peak-hold circuit are converted
into a digital signal and are held by the data latch at
the trigger moment.
In the second circuit, the ESD-pulse signal is applied
without delay to a second A/D converter, which continuously
evaluates the signal. The trigger pulse that was generated
in the analog comparator in the first circuit is used to
hold the ESD-pulse signal on a data latch. Because the trigger
pulse is delayed by a total of 30 nanoseconds, the current
value of the ESD pulse is evaluated after that interval
and latched as a digital signal on the second data latch.
A digital signal that is evaluated on the peak current
appears therefore on the first data latch, while a digital
signal that is the evaluation of the secondary current of
the ESD pulse at 30 nanoseconds appears on the second data
latch. The logic circuit converts the data-latch signals
to TTL-level signals and supplies them via NAND gates to
two indicator LEDs. The first LED will glow green when the
peak-current value registers 30 A ± 15%; otherwise,
it remains off. The second LED will light up when the secondary-current
value corresponds to 16 A ± 35%; otherwise, it remains
off. When both LEDs display green lights, the peak current
of the ESD pulse and the current at 30 nanoseconds are both
expected to be within tolerance, as mentioned in the IEC
61000-4-2 standard.
The ESD Target. In order for a reliable measurement
result to be achieved, the ESD target needs to be linear
up to a frequency level of at least 1 GHz. The system's
ESD target is a Pelligrini target designed using recommendations
from IEC 61000-4-2 and from recent research work. It incorporates
low-inductance resistors that are capable of absorbing the
2-kW peak power of the ESD-pulse discharge without damage.
The input resistance of the gun is 2 W, and the output resistance
is 50 W.
Emerging ESD Standards for Commercial Equipment
1. ANSI C63 ESD Working Group
This group has recently published its second
draft, which addresses deficiencies existing
in ESD standards by introducing:
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Limited control of peak current
as a function of precharge voltage.
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A modified bandwidth
(up to 18 GHz) of the calibration target
(former Pelligrini in IEC 61000-4-2).
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Definition of discharge
current derivative (di/dt), especially for
the first peak.
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The limit of generated E/H
fields.
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A modified and clearer test
setup, especially concerning the position
of the return-current strap.
As with calibration of
a compliant gun, a high-bandwidth target is
needed, but also a tapered adapter (2/50  ).
This standard dates from 1995. It is required
by an IEC central office ruling to be revised
within five years of that date, which is why
Working Group 9 of IEC Technical Committee
77B was recently formed to revise the standard.
The committee's chairman stated that the revised
standard will probably be published in 2002.
One of alterations to the standard is in
the definition of test setups for nonearthed
(Class II) equipment. For nonearthed equipment,
the coupling phenomena will become very important.
Test results differing by a factor of up to
200% are now possible owing to poor or missing
test setup definitions in the existing standard.
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Measurement of the transfer function of the Pelligrini
target was conducted by means of the face-to-face method.
(See Figure 3 for a presentation of results.) This method
involves connecting two Pelligrini targets together by their
2-W target planes. The Pelligrini outputs are 50 W, which
facilitates connection to a network analyzer or a tracking
generator/ receiver.
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Figure 3. Performance of the Pelligrini
target (tracking generator output level = 70 dBµV).
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If one builds the Pelligrini target as described in IEC
61000-4-2, its bandwidth is not more than approximately
700800 MHz. With the version built for the system
under discussion, a bandwidth of 3 GHz was obtained. In
fact, a bandwidth of more than 10 GHz was calculated in
simulations. This is not as high as the 18 GHz the ANSI
C63 ESD working group proposes (see sidebar), but it is
certainly a more cost-effective approach for now.
The lumped model presented in Figure 4 represents the complete
ESD test bed. The model has to be used with care; it cannot
accommodate for the traveling waves that are present in
the natural ambient.
The first part of the lumped model represents the human
body itself. Typical values for its components are 150 pF
for capacitance (CH), 0.42
µH for inductance (LH),
and 500 W for resistance (RH).
The second part represents the human arm and finger, with
the following typical values: CA
= 325 pF, LA = 0.050.2
µH, and RA = 20200
W. The capacitors CADUT,
CFDUT, and CDUT
form the interface with the device under test
(DUT) and have typical values between 3 and 25 pF.
In the ESD-gun calibration procedure according to IEC 61000-4-2,
a bulky 1.5 x 1.5-m metal reference plane in which
the Pelligrini target is mounted is used to realize the
capacitors CADUT and CFDUT.
The present apparatus avoids using such a plate, forming
the capacitors by means of an L-shaped reference plane that
is described in the IEC 60801-2 standard and which is also
used in automotive testing.
The complete setup of the ESD-pulse validation system
appears in Figure 5.
Figure 6 diagrams the method used to adjust the validation
system to the values required by IEC 61000-4-2, which are